No software license needed

Your STDF files.
Instant insights.

Upload any .stdf or .std file — parametric summary, Cpk/Ppk, wafer map and yield in under 30 seconds. Works in your browser. Nothing to install. Your data never leaves your computer.

⚡ Try it free — upload your STDF See what it does
PTR · FTR · MPR supported Works with every ATE platform No software license needed Data never stored — ever
stdf.siltest.com
Overall yield
89.7%
Total parts
58
Failures
6
Parameters
102
Test nameUnitsLo limHi limMeanStdCpkYield
SHORT_LNA_A1GV-2.2-1.8-1.99490.0019Pro100%
SHORT_LNA_A1DV-1.1-0.8-0.9380.049Pro96.6%
VDD_CURRENTmA45.075.060.23.1Pro100%
GAIN_A_DBdB18.022.020.10.52Pro98.3%
Why engineers love it

The tools you use today
weren't built for this

Every test engineer knows the frustration. STDF files sitting on a network drive. The right software not installed. Opening a file takes 45 minutes of setup.

💸
4–5 digit annual license fees. For features you'll never use.
It's like paying for a 7-star hotel suite when all you need is a coffee. Powerful platforms are built for large IDM teams. Your team needs to open an STDF file and see what's in it.
→ Free to start. €19/month for the full analysis toolkit.
⏱️
Manual Cpk analysis takes hours every week
Engineers spend 2–4 hours every week on the same reports. Scripts break. Data formats change. Thousands of posts in engineering communities ask "how to automate Cpk per wafer." This pain is universal.
→ Upload STDF, get full Cpk analysis in 30 seconds
🔒
Wait — you want me to upload production test data to a website?
That's exactly what European engineers ask. And they're right to ask. STDF files contain device characteristics, yield, bin distribution, test limits. Competitive intelligence. You should never upload this to a cloud platform that stores it.
→ We don't store anything. Files processed in memory, immediately discarded. Zero data retention.
📁
STDF is everywhere. Tools to read it aren't.
Every ATE platform outputs STDF. But opening it without the right software means converting to CSV, losing metadata, or raising an IT ticket. Every time.
→ Drag, drop, done. No conversion. No IT ticket.
Built for Europe. GDPR-ready.

Your production data
is yours. Full stop.

We know what's in an STDF file. Device characteristics. Test limits. Yield. Bin distribution. Parametric performance. This is some of the most commercially sensitive data your company produces.

That's exactly why we built STDF Quick Viewer the way we did.

🧠
Processed in memory only
Your file is parsed in your browser session's memory. Never written to disk, never moved to a database, never touched after the session ends.
🚫
Zero data retention
We have no file storage. No cloud bucket. No database of your test results. Technically impossible to leak what we never store.
🇪🇺
Built in Germany, for European engineers
SilTest is a European semiconductor company. We understand GDPR and data sovereignty. Your NDA covers your data — our architecture ensures it never leaves your hands.
🔍
No login needed for the free tier
You don't even have to tell us who you are. No email, no account, no tracking. Just upload and go.
What you get

Everything a test engineer
needs. Nothing they don't.

📊
Parametric summary
Every PTR test: mean, std, min, max, pass/fail counts, yield %. All tests, instantly.
FREE
🗺️
Wafer map
Die-level pass/fail by bin. Spot spatial patterns — edge ring, scratch lines, center defects — at a glance.
FREE
📦
Bin distribution
Hard and soft bin summary with bar chart. Instant yield by bin. No scripting needed.
FREE
📋
Lot information
Full MIR record — lot ID, device, operator, tester, loadboard, package, facility. Everything from the file header.
FREE
📐
Cpk / Ppk per parameter
Process capability for every parametric test. Colour-coded: green ≥1.67, amber ≥1.33, red below. The number your customer asks for.
PRO — €19/mo
📄
PDF report export
One-click branded PDF — parametric table, Cpk summary, wafer map, bin chart. Ready to send to your customer.
PRO — coming soon
📈
Multi-file lot trends
Upload multiple files — track yield and Cpk trends across lots. Spot process drift before it becomes an excursion.
PRO — coming soon
🔒
Zero data retention
Files processed in memory, never stored. Your production data stays yours. GDPR compliant by architecture, not by policy.
ALL TIERS
Compatibility

Works with every ATE platform and every device type that generates STDF files.

Logic · Mixed-signal · RF · Analog · Power · Memory · Automotive · Industrial

Who uses it

Built for every engineer
who touches test data

From wafer sort to final test, from startup to OSAT — anyone who opens an STDF file benefits from seeing their data in 30 seconds.

🔬
Test Engineers
Open any file from any tester instantly. Debug failures without a full analysis environment.
📊
Product Engineers
Cpk per parameter without writing a single script. Weekly yield reports in seconds, not hours.
🏭
OSATs
Share yield and bin summaries with fabless customers instantly. No license required on either side.
🚀
Fabless Startups
Same parametric capability your IDM competitors use, at a fraction of the cost. No procurement needed.
🔧
ATE Service Firms
Share professional yield reports with customers who don't have ATE software. Zero friction.
🎯
IC Designers
See how your silicon is actually performing on the tester. Parametric trends tell you more than a pass/fail.
How it compares

The right tool for the right job

Powerful analysis platforms are built for large teams running hundreds of devices. STDF Quick Viewer is built for the engineer who needs to open a file and see what's in it — right now.

Feature Enterprise yield platforms STDF Quick Viewer
Open and view STDF filesYesYes
Works in browser, nothing to installNoYes ✓
No external software license neededNoYes ✓
Parametric summary + yieldYesYes
Wafer map + bin analysisYesYes
Cpk / Ppk per parameterYesYes (Pro)
Free tier — try before you buyNoYes — 3 files/day
Annual cost4–5 digit license feeFree → €228/year
Test data stored on vendor serversOften yesNever — zero retention
Works without IT or procurementNoYes ✓
Suitable for fabless startups & OSATsRarelyBuilt for them

STDF Quick Viewer complements — not replaces — the advanced yield analytics platforms your team already uses.

Pricing

Start free. Upgrade when you need more.

No credit card for the free tier. No sales call for Pro. Cancel any time.

Free
€0
No account needed
  • 3 files per day, 50 MB max
  • Parametric summary + yield
  • Wafer map + bin chart
  • Lot header information
  • CSV download
  • Cpk / Ppk analysis
  • PDF report export
  • Multi-file trends
Try free →
Most popular
Pro
€19/month
1 engineer seat · cancel any time
  • Unlimited files, 500 MB max
  • Everything in Free
  • Cpk / Ppk per parameter
  • PDF report export
  • Multi-file lot trends
  • Wafer yield trending

Team or enterprise pricing? Contact us

Your STDF file is waiting.
It takes 30 seconds.

No software license. No install. No credit card.
Drag, drop, and see your data. Your file never leaves your computer.

⚡ Try STDF Quick Viewer free