Drop in a .stdf or .std file and get a parametric summary, wafer map, bin chart, and Cpk/Ppk — right in your browser. No install, no IT ticket, no waiting on a software license.
Every test engineer has lived some version of this. Here's what we kept hearing.
Device characteristics, yield, bin counts, parametric limits — an STDF file is a pretty complete picture of how your silicon performs. That's not data you hand to a random web app.
So we didn't build a random web app. There's no database behind this with your test results in it. There's nothing to leak, because nothing is kept.
Supports every ATE platform. If it writes a standard STDF file, this reads it — logic, mixed-signal, RF, analog, power, memory, automotive.
From wafer sort to final test, from a two-person fabless startup to an OSAT running someone else's lots — if you touch test data, this saves you time.
If your team runs an enterprise yield platform for hundreds of devices, keep it — this isn't trying to replace that. It's for the moment you just need to open one file and see what's in it.
| Feature | Enterprise platforms | STDF Quick Viewer |
|---|---|---|
| Open and view STDF files | Yes | Yes |
| Works in browser, nothing installed | No | Yes |
| No external software license | No | Yes |
| Parametric summary + yield | Yes | Yes |
| Wafer map + bin analysis | Yes | Yes |
| Cpk / Ppk per parameter | Yes | Yes (Pro) |
| Free tier to try first | No | 3 files/day |
| Annual cost | 4–5 digit license | Free → €228/yr |
| Test data stored on vendor servers | Often | Never |
| Works without IT involvement | No | Yes |
No credit card for the free tier, no sales call for Pro, cancel whenever.
Need a team plan? Contact us
No license, no install, no credit card for the free tier.
It's parsed in your browser and never leaves your computer.